Showing results: 481 - 495 of 683 items found.
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P-20 Series -
Auburn Technology
The P-20A is a PASSIVE 10:1 RF VOLTAGE PROBE with a 50 Volt DC BLOCK built in. It has been designed to allow users of RF test equipment to use standard signal tracing techniques. The P-20A makes it possible to conveniently and accurately monitor or inject signals up to 3 GHz into RF circuits without significantly loading or detuning them.
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TH852 -
Matco Tools
*Can be used with most 12V mini jump starters with the standard EC5 port*Allows for more portability and freedom from long battery wires*Factory correct terminals means less of a need to back probe*Isolates component from the rest of the circuit which results in less damage to entire wiring/computer modules*No need to remove component for bench test
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260-8 & 260-8P -
Simpson Electric Company
Nothing beats a Simpson 260-8 for monitoring fluctuating trends and rates. Portable yet with benchtop accuracy, the 260-8 is ideal for use anywhere -- workshop, lab or in the field. The 260-8P features an additional resettable overload protection circuit and audible continuity checking. Both versions come with batteries, manual and full-size test leads with threaded probe tips and screw-on alligator clips.
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Magna-Mike 8600 -
Evident Scientific
The Magna-Mike® 8600 is a portable thickness gauge that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
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Extech MN36 -
Extech Instruments Corporation
The Extech MN36 digital multimeter is compact but still packed with features. Capable of measuring AC and DC voltage up to 600 volts, the MN36 is autoranging, which means it automatically displays readings with the proper decimal place location and maximum resolution. Comes with protective rubber holster, 2xAAA batteries, bead wire Type K temp. probe and test leads.
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FS2602 -
FuturePlus Systems
The FS2602 is our the latest logic analyzer probe used to test DDR5 SO-DIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 SO-DIMMs running at ~4000MT/s.
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Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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WIT Co., Ltd
It is a simple and convenient item that allows you to search for and replace the test probe at the same time. With needle-nose pliers, when pulling out a pin in a narrow space, excessive force was applied, which could damage the adjacent pin or widen the hole diameter. With our original pulling tool that supports the minimum pitch, you can easily pull out without damaging the adjacent pin.
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LOM-510A -
IET Labs
The Micro-Ohmmeter has 4 digits, 0.02% basic accuracy and 1 resolution. The 4-terminal kelvin measurement connection minimizes lead resistance errors and 80 dB of ac noise rejection provides rock-steady readings even in noisy locations. The micro-ohmmeter comes with rugged 4-terminal test clips and a large selection of optional probes, clips and fixtures allowing attachment to any low-resistance unknown.
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Vertical Space -
SV Probe, Inc.
With our TrioTM vertical and LogicTouchTM fine pitch vertical technologies an interconnect, otherwise known as a space transformer (ST), is used between the printed circuit board and the probe head, transferring the test signal. SV TCL provides a variety of space transformers, each with its own specific benefits and applications. SV TCL offers a number of space transformer options including:
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Sensors -
Foerster Instruments, Incorporated
We offer a comprehensive range of standard and customised sensors, probes and coils for component testing. If the wide selection of standard sensors does not optimally solve your testing task, we offer you an individual new development specially adapted to your testing task. Thanks to our many years of experience, you receive reliable sensor technology for reproducible test results.
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HS-QSD -
HenergySolar
HS-QSD Quick Silicon Discriminator is specially designed for silicon sorting,it can quickly test the silicon type, heavy-dopedt, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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KMF 1 -
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR KMF 1. The KMF 1 search receiver is used according to the step voltage method. The cable line is scanned with two measurement probes that can be dismantled during transport. The battery-operated device is also suitable for locating multiple consecutive sheath faults.* Battery mode* Zero point compensation* accurate location of cable sheath faults* battery test
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CX-T04 -
Shenzhen Chuangxin Instruments Co., Ltd.
This Spring Impact hammer is strictly designed according to IEC60068-2-75, IEC884 and UL1244 GB/T2423.55-2006, GB4706.1, GB8898 and GB7000 standards. It is used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance to IEC\EN, \UL\CSA and other international Standards.
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Maury Microwave Corporation
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.